MIL-DTL-12779D
TABLE V. Defect inspections Continued.
2/ Level II, Level IV, or Level VII refer to verification level II, verification level IV, or
verification level VII respectively of sampling plans in MIL-STD-1916.
3/ Defects other than those listed in MIL-STD-636 (NATO, 9mm and Caliber .45 Section).
4/ The crimp shall be considered to be missing or insufficient when the open mouth diameter of
the cartridge case exceeds 0.385 inch.
5/ Inspection for incorrect cartridge type shall be performed during or immediately prior to the
packaging operation, which is before cartridge lot acceptance. Occurrence of any type other
than blank, dummy or inert shall be classified as a critical defect. Occurrence of a dummy or
inert shall be classified as a major defect. If a defect is found at 100% inspection, which is
during or immediately prior to the packaging operation inspection, the incorrect cartridge type
shall be replaced with a correct cartridge type. For verification level inspection, a VL VII
sample shall be selected at random from the lot. From this VL VII sample, a VL IV sample
shall be selected at random. A VL IV sample shall be inspected for major and critical incorrect
cartridge type defects. The cartridges that remain of the initial VL VII sample after the VL IV
sample is selected shall be inspected for critical incorrect cartridge type defects only. If a
critical defect is found during VL VII inspection, the lot shall be withheld from acceptance and
approved procedures for product disposition shall be followed. If a major defect is found
during VL IV inspection, the incorrect cartridge type shall be replaced with a correct cartridge
type and the entire lot shall be subjected to a subsequent 100% inspection. During the
subsequent inspection, any incorrect cartridge type found shall be replaced with a correct
cartridge type.
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